Technologies

We propose an optical technique for the fast check of the presence, on the exposed surfaces of persons and objects, of explosives and their precursors, or drugs, or in general materials which are not allowed in restricted environments: airports, courts, places of worship, etc. The technique yields bi-dimensional pictures, with exposure time of < 1 sec, reporting the target substances, and their locations and quantities. The technique already provided laboratory preliminary results, to be completed, and fully validated for sensitivity and selectivity.

At IFN-CNR, in collaboration with Politecnico di Milano-Department of Physics, we have developed Raman microscopy approaches compatible with the study and characterization of biological and industrial samples. In detail, our facility houses a self-built spontaneous confocal Raman microscope with the following characteristics: two excitation lasers (660nm and 785nm), inverted microscope (Olympus IX-73) and Princeton spectrometer / CCD.

The development of new materials with near-infrared emission (NIR, 700 – 1000 nm) represent an important target in the technological progress of innovative active components for OLED devices (including flexible ones), surveillance systems, autonomous driving, night vision sensors, fiber optic telecommunications and medical systems. In all these fields it still lacks a commercial NIR-OLED technology.

Safe, efficient and specific nano-delivery systems are increasingly needed for precision and regenerative medicine and targeted therapies (e.g. anticancer and antimicrobial therapies), as well as for  the cosmetic and nutraceutical sectors’ applications. Despite the appreciable success of synthetic nanovectors, like for example liposomes, their clinical and market application is hampered by some limitations: • large scale production, • low cost production • intrinsic toxicity • limited cellular uptake • limited consumer acceptance.

X-ray imaging techniques can work in i) "full-field mode" in which the object to study (or part of it) is completely illuminated by the X-ray beam; ii) "scanning mode" in which an X-ray beam, focused through an opportune optics, illuminates in succession contiguous areas of the sample under examination, and the transmitted wave is measured by a detector placed at a proper distance from it. One of these X-ray scanning microscopes is available at the facility (X-ray MicroImaging, XMIL@b) of the Institute of Crystallography (CNR-Bari).