Technologies

The development of new materials with near-infrared emission (NIR, 700 – 1000 nm) represent an important target in the technological progress of innovative active components for OLED devices (including flexible ones), surveillance systems, autonomous driving, night vision sensors, fiber optic telecommunications and medical systems. In all these fields it still lacks a commercial NIR-OLED technology.

X-ray imaging techniques can work in i) "full-field mode" in which the object to study (or part of it) is completely illuminated by the X-ray beam; ii) "scanning mode" in which an X-ray beam, focused through an opportune optics, illuminates in succession contiguous areas of the sample under examination, and the transmitted wave is measured by a detector placed at a proper distance from it. One of these X-ray scanning microscopes is available at the facility (X-ray MicroImaging, XMIL@b) of the Institute of Crystallography (CNR-Bari).