Technologies

The final technology will add polarimetric capability to imaging cameras in the NUV/optical, providing simultaneous measurements of the different polarization states of the light. This will be obtained by the development of an innovative coating based on nanostructured emissive materials sensitive to the polarization of the incident light. A  double layer film of two organic systems will be coupled to image detectors so that the two polarization components of the incoming light are converted into two different colors.

This technology concerns the development of new eco-sustainable UV physical/mineral filters with the aim of offering important innovations per the cosmetic sector. This, encouraged by European initiatives in the Green-Deal context, is constantly looking for new components with improved protection of the human health and the environment.

The NanoMicroFab infrastructure, support companies operating in the field of micro and nanoelectronics through the supply of materials, development of processes, design, fabrication and characterization of materials and devices. NanoMicroFab makes use of existing CNR facilities of the Institute of Microelectronics and Microsystems, the Institute of Photonics and Nanotechnologies and the Institute for the Structure of Matter and provides: • a complete line of development of devices based on wide band gap semiconductors.

The metasurface optomechanical modulator is a device designed to modulate the amplitude, phase and polarization of a beam of electromagnetic radiation, independently, or simultaneously, according to prescribed paths in the parameter space (for example, as regards polarization, paths on the Poincaré sphere). The concept of our device can be applied to the entire spectrum of electromagnetic waves: from radio frequency, to microwaves (GHz), to millimeter waves (THz), to far and near infrared radiation, and to visible light.

The invention consists in a special regulation method of the horizontal axes of operating and rubbing wheels of a centerless grinding machine coupled with an opportune blade profile, allowing a continuous regulation of blade rest angle (angle between tangent to blade profile at the contact point with the work piece and the horizon, denoted by γ) and workpiece height (denoted by hw), without requiring blade substitution and/or manual regulations.

X-ray imaging techniques can work in i) "full-field mode" in which the object to study (or part of it) is completely illuminated by the X-ray beam; ii) "scanning mode" in which an X-ray beam, focused through an opportune optics, illuminates in succession contiguous areas of the sample under examination, and the transmitted wave is measured by a detector placed at a proper distance from it. One of these X-ray scanning microscopes is available at the facility (X-ray MicroImaging, XMIL@b) of the Institute of Crystallography (CNR-Bari).