Technologies

Quartz tuning forks are employed in scanning atomic force microscopy (AFM), as well as in some derived techniques, as high sensitivity detectors of interactions, of both conservative and dissipative kind, between the AFM nanometric probe and the investigated surface. However, the contributions of the two kinds of interaction result as convoluted in the sensor response, preventing fully quantitative measurements of the quantities of interest.

The technology concerns planar optical antennas composed of thin metal films and dielectric materials for the efficient direction of the light emitted by light sources, such as fluorescent molecules and bio-markers. They consist of a reflector layer, adjacent to the substrate, and a director, semi-reflective, between which the emitter is positioned, integrated into a homogeneous dielectric layer.