Technologies

The proposed technology consists of a portable device for monitoring the freshness of fish, based on its smell. The device is based on a gas sensor and pattern recognition software to correlate the sensor signal to the freshness of the food. The technology is designed for its integration into domestic or industrial refrigerators.

Digital Eye is an innovative, rapid and high-precision intelligent computer vision system for the non-destructive and contactless evaluation of quality and shelf-life of whole or fresh-cut fruit and vegetables. It integrates advanced vision and artificial intelligence technologies to estimate parameters useful to evaluate the quality of fruit and vegetables, during both the harvesting phase and the cold chain.

Silicon nanowires (SiNWs) are 1D structures with diameter ranging from few tens to hundreds of nanometers and length varying from few tens of nanometers to millimiters. SiNWs are fabricated in the labs of the IMM-CNR, Rome Unit,  by using bottom-up technologies such as plasma enhanced chemical vapor deposition (PECVD) at low growth temperature ((≤350°C), allowing the use of plastic and glassy substrates. Their electrical properties can be tuned by controlling the p/n doping during the growth.

VisLab laboratory of IMM possesses a latest generation Raman micro-spectroscope equipped for vibrational measurements with high spatial and spectral resolution, at controlled temperature and in fast-imaging. The apparatus can be used to collect information and chemico-physical maps without the need for sample preparation and alteration, therefore for non-destructive studies and in operating conditions.

The Nikon reference centre at IBPM ( www.imagingplatformibpmcnr.it ) is a microscopy platform for high resolution imaging of fixed samples and live cells (time-lapse video recording, both wide field and confocal spinning disk). Multimodal (fluorescence and transmitted light) and multidimensional (in x,y,z, 4 wavelengths, over time) acquisition modes are in place.

Quartz tuning forks are employed in scanning atomic force microscopy (AFM), as well as in some derived techniques, as high sensitivity detectors of interactions, of both conservative and dissipative kind, between the AFM nanometric probe and the investigated surface. However, the contributions of the two kinds of interaction result as convoluted in the sensor response, preventing fully quantitative measurements of the quantities of interest.