Quartz tuning forks are employed in scanning atomic force microscopy (AFM), as well as in some derived techniques, as high sensitivity detectors of interactions, of both conservative and dissipative kind, between the AFM nanometric probe and the investigated surface. However, the contributions of the two kinds of interaction result as convoluted in the sensor response, preventing fully quantitative measurements of the quantities of interest.
# Record card
37
Description
Thematic areas
Chemicals & Physics / Micro and nanotechnology related to physical, chemical and exact sciences
Measurement tools and Standards