Technologies

In this section it is possible to view, also through targeted research, the technologies inserted in the PROMO-TT Database. For further information on the technologies and to contact the CNR Research Teams who developed them, it is necessary to contact the Project Manager (see the references at the bottom of each record card).

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Piezoelectric tuning-fork sensor for scanning probe microscopy with high sensitivity

# Record card
37
Description

Quartz tuning forks are employed in scanning atomic force microscopy (AFM), as well as in some derived techniques, as high sensitivity detectors of interactions, of both conservative and dissipative kind, between the AFM nanometric probe and the investigated surface. However, the contributions of the two kinds of interaction result as convoluted in the sensor response, preventing fully quantitative measurements of the quantities of interest.

Thematic areas
Chemicals & Physics / Micro and nanotechnology related to physical, chemical and exact sciences
Measurement tools and Standards