Nowadays, to properly design and develop advanced materials capable to preserve for long times their performance under aggressive environments such as power generation plants, renewables, nuclear reactors and electronics of new generation, transport on ground and on space, aeronautics, catalysis, biomedical implants, the optimization of metallurgical processes involved is crucial.
Technologies
In this section it is possible to view, also through targeted research, the technologies inserted in the PROMO-TT Database. For further information on the technologies and to contact the CNR Research Teams who developed them, it is necessary to contact the Project Manager (see the references at the bottom of each record card).
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VisLab laboratory of IMM possesses a latest generation Raman micro-spectroscope equipped for vibrational measurements with high spatial and spectral resolution, at controlled temperature and in fast-imaging. The apparatus can be used to collect information and chemico-physical maps without the need for sample preparation and alteration, therefore for non-destructive studies and in operating conditions.
Solid State Nuclear Magnetic Resonance spectroscopy (SSNMR) is today one of the most powerful techniques for characterizing solid and soft materials and systems. This spectroscopy allows the detailed characterization of structural and dynamic properties over large spatial (0.1-100 nm) and time (102-10-11 s) scales. Accessing these properties allows a deep knowledge of a material to be obtained and its design and optimization to be oriented.
The instrument which is under development is a non-conventional portable Raman spectrometer. Raman spectrometers provide the molecular composition of the material surfaces, essential for their identification. The instrument peculiarity relies in the simultaneous acquisition of Raman spectra at imaged position and at different micrometric distances (offset) from the laser illumination area.
X-ray imaging techniques can work in i) "full-field mode" in which the object to study (or part of it) is completely illuminated by the X-ray beam; ii) "scanning mode" in which an X-ray beam, focused through an opportune optics, illuminates in succession contiguous areas of the sample under examination, and the transmitted wave is measured by a detector placed at a proper distance from it. One of these X-ray scanning microscopes is available at the facility (X-ray MicroImaging, XMIL@b) of the Institute of Crystallography (CNR-Bari).