Technologies

Nowadays, to properly design and develop advanced materials capable to preserve for long times their performance under aggressive environments such as power generation plants, renewables, nuclear reactors and electronics of new generation, transport on ground and on space, aeronautics, catalysis, biomedical implants, the optimization of metallurgical processes involved is crucial.

Our proposal consists in a quantum sensor based on a superconduc:ng resonator. The working principle is based on the exponential growth of the susceptibility in proximity of a critical phase transition, where the system quickly switches from the vacuum state to a strong emission of easily detectable microwave signals, in response to extremely weak electromagnetic signals. The sensor can detect microwave and radiowave signals, with single-photon resolu:on.

VisLab laboratory of IMM possesses a latest generation Raman micro-spectroscope equipped for vibrational measurements with high spatial and spectral resolution, at controlled temperature and in fast-imaging. The apparatus can be used to collect information and chemico-physical maps without the need for sample preparation and alteration, therefore for non-destructive studies and in operating conditions.

The metasurface optomechanical modulator is a device designed to modulate the amplitude, phase and polarization of a beam of electromagnetic radiation, independently, or simultaneously, according to prescribed paths in the parameter space (for example, as regards polarization, paths on the Poincaré sphere). The concept of our device can be applied to the entire spectrum of electromagnetic waves: from radio frequency, to microwaves (GHz), to millimeter waves (THz), to far and near infrared radiation, and to visible light.

The technology concerns planar optical antennas composed of thin metal films and dielectric materials for the efficient direction of the light emitted by light sources, such as fluorescent molecules and bio-markers. They consist of a reflector layer, adjacent to the substrate, and a director, semi-reflective, between which the emitter is positioned, integrated into a homogeneous dielectric layer.

X-ray imaging techniques can work in i) "full-field mode" in which the object to study (or part of it) is completely illuminated by the X-ray beam; ii) "scanning mode" in which an X-ray beam, focused through an opportune optics, illuminates in succession contiguous areas of the sample under examination, and the transmitted wave is measured by a detector placed at a proper distance from it. One of these X-ray scanning microscopes is available at the facility (X-ray MicroImaging, XMIL@b) of the Institute of Crystallography (CNR-Bari).