Nowadays, to properly design and develop advanced materials capable to preserve for long times their performance under aggressive environments such as power generation plants, renewables, nuclear reactors and electronics of new generation, transport on ground and on space, aeronautics, catalysis, biomedical implants, the optimization of metallurgical processes involved is crucial.

VisLab laboratory of IMM possesses a latest generation Raman micro-spectroscope equipped for vibrational measurements with high spatial and spectral resolution, at controlled temperature and in fast-imaging. The apparatus can be used to collect information and chemico-physical maps without the need for sample preparation and alteration, therefore for non-destructive studies and in operating conditions.

The proposed technology offers a novel and versatile method for detecting cracks in insulating materials of electrically polarized metal devices, i.e. dielectric coatings on metals, especially in low-pressure gas environments. It uses an ionized plasma that interacts uniformly with the insulating surface, allowing to detect defects invisible to the naked eye. The detection occurs in a single test without changing the environmental conditions and without risking harmful electrical discharges.

The technology refers to an innovative plasma (ionized gas) source operating at atmospheric pressure and low electric power levels. A cold plasma is produced, characterized by an ion temperature significantly lower than the electron temperature. Partial ionization of a Helium flux is induced by a time-varying electric field in between two parallel grids, both perpendicular to the flux itself.

The invention consists in a special regulation method of the horizontal axes of operating and rubbing wheels of a centerless grinding machine coupled with an opportune blade profile, allowing a continuous regulation of blade rest angle (angle between tangent to blade profile at the contact point with the work piece and the horizon, denoted by γ) and workpiece height (denoted by hw), without requiring blade substitution and/or manual regulations.

X-ray imaging techniques can work in i) "full-field mode" in which the object to study (or part of it) is completely illuminated by the X-ray beam; ii) "scanning mode" in which an X-ray beam, focused through an opportune optics, illuminates in succession contiguous areas of the sample under examination, and the transmitted wave is measured by a detector placed at a proper distance from it. One of these X-ray scanning microscopes is available at the facility (X-ray MicroImaging, XMIL@b) of the Institute of Crystallography (CNR-Bari).