Technologies

Nowadays, to properly design and develop advanced materials capable to preserve for long times their performance under aggressive environments such as power generation plants, renewables, nuclear reactors and electronics of new generation, transport on ground and on space, aeronautics, catalysis, biomedical implants, the optimization of metallurgical processes involved is crucial.

The final technology will add polarimetric capability to imaging cameras in the NUV/optical, providing simultaneous measurements of the different polarization states of the light. This will be obtained by the development of an innovative coating based on nanostructured emissive materials sensitive to the polarization of the incident light. A  double layer film of two organic systems will be coupled to image detectors so that the two polarization components of the incoming light are converted into two different colors.

The constant demand for more powerful and energy-efficient electronic devices than existing ones is challenging scientists and companies to develop innovative solutions that can address such primary technological needs. Based on a recent scientific discovery made by our team we have developed a technology for superfast and extremely scalable logic and computing circuits with minimal energy losses, which has the potential to become the leading technology in the future world of largescale computing and telecommunication infrastructures.

VisLab laboratory of IMM possesses a latest generation Raman micro-spectroscope equipped for vibrational measurements with high spatial and spectral resolution, at controlled temperature and in fast-imaging. The apparatus can be used to collect information and chemico-physical maps without the need for sample preparation and alteration, therefore for non-destructive studies and in operating conditions.

Mirrors for space applications, besides featuring suitable optical properties, should be light, resistant to mechanical stresses, and unsensitive to light-shadow thermal cycling. The standard optical materials easily fulfill optical and thermal requirements, but are fragile, and the mirrors must be thick (typically 1/6 of the diameter). For this reason they are heavy, and the only available solution is to lighten them, by removing material from the back side, still preserving the necessary mechanical robustness and optical quality.

The NanoMicroFab infrastructure, support companies operating in the field of micro and nanoelectronics through the supply of materials, development of processes, design, fabrication and characterization of materials and devices. NanoMicroFab makes use of existing CNR facilities of the Institute of Microelectronics and Microsystems, the Institute of Photonics and Nanotechnologies and the Institute for the Structure of Matter and provides: • a complete line of development of devices based on wide band gap semiconductors.

The invention consists in a special regulation method of the horizontal axes of operating and rubbing wheels of a centerless grinding machine coupled with an opportune blade profile, allowing a continuous regulation of blade rest angle (angle between tangent to blade profile at the contact point with the work piece and the horizon, denoted by γ) and workpiece height (denoted by hw), without requiring blade substitution and/or manual regulations.

WSense provides customizable and modular real-time, bi-directional, in-situ monitoring tools capable of sending real-time alarms. It makes possible to monitor the entire water column, on areas that can scale from a few tens of square meters to hundreds or thousands of square meters depending on the number of nodes deployed as needed. The monitoring system is implemented using submarine wireless communication nodes (W-Nodes) integrated with probes to monitor various parameters.

X-ray imaging techniques can work in i) "full-field mode" in which the object to study (or part of it) is completely illuminated by the X-ray beam; ii) "scanning mode" in which an X-ray beam, focused through an opportune optics, illuminates in succession contiguous areas of the sample under examination, and the transmitted wave is measured by a detector placed at a proper distance from it. One of these X-ray scanning microscopes is available at the facility (X-ray MicroImaging, XMIL@b) of the Institute of Crystallography (CNR-Bari).