Technologies

The object of the technology is the development of a transferable methodology from the laboratory scale to the pilot scale to be validated in the industrial setting for the treatment of basic waste of natural polymers of agro-food or manufacturing industry.

The NanoMicroFab infrastructure, support companies operating in the field of micro and nanoelectronics through the supply of materials, development of processes, design, fabrication and characterization of materials and devices. NanoMicroFab makes use of existing CNR facilities of the Institute of Microelectronics and Microsystems, the Institute of Photonics and Nanotechnologies and the Institute for the Structure of Matter and provides: • a complete line of development of devices based on wide band gap semiconductors.

Solid State Nuclear Magnetic Resonance spectroscopy (SSNMR) is today one of the most powerful techniques for characterizing solid and soft materials and systems. This spectroscopy allows the detailed characterization of structural and dynamic properties over large spatial (0.1-100 nm) and time (10²-10^-11 s) scales. Accessing these properties allows a deep knowledge of a material to be obtained and  its design and optimization to be oriented.

The metasurface optomechanical modulator is a device designed to modulate the amplitude, phase and polarization of a beam of electromagnetic radiation, independently, or simultaneously, according to prescribed paths in the parameter space (for example, as regards polarization, paths on the Poincaré sphere). The concept of our device can be applied to the entire spectrum of electromagnetic waves: from radio frequency, to microwaves (GHz), to millimeter waves (THz), to far and near infrared radiation, and to visible light.

The technology concerns planar optical antennas composed of thin metal films and dielectric materials for the efficient direction of the light emitted by light sources, such as fluorescent molecules and bio-markers. They consist of a reflector layer, adjacent to the substrate, and a director, semi-reflective, between which the emitter is positioned, integrated into a homogeneous dielectric layer.

X-ray imaging techniques can work in i) "full-field mode" in which the object to study (or part of it) is completely illuminated by the X-ray beam; ii) "scanning mode" in which an X-ray beam, focused through an opportune optics, illuminates in succession contiguous areas of the sample under examination, and the transmitted wave is measured by a detector placed at a proper distance from it. One of these X-ray scanning microscopes is available at the facility (X-ray MicroImaging, XMIL@b) of the Institute of Crystallography (CNR-Bari).