Technologies

The constant demand for more powerful and energy-efficient electronic devices than existing ones is challenging scientists and companies to develop innovative solutions that can address such primary technological needs. Based on a recent scientific discovery made by our team we have developed a technology for superfast and extremely scalable logic and computing circuits with minimal energy losses, which has the potential to become the leading technology in the future world of largescale computing and telecommunication infrastructures.

The proposed technology offers a novel and versatile method for detecting cracks in insulating materials of electrically polarized metal devices, i.e. dielectric coatings on metals, especially in low-pressure gas environments. It uses an ionized plasma that interacts uniformly with the insulating surface, allowing to detect defects invisible to the naked eye. The detection occurs in a single test without changing the environmental conditions and without risking harmful electrical discharges.