Technologies

Quartz tuning forks are employed in scanning atomic force microscopy (AFM), as well as in some derived techniques, as high sensitivity detectors of interactions, of both conservative and dissipative kind, between the AFM nanometric probe and the investigated surface. However, the contributions of the two kinds of interaction result as convoluted in the sensor response, preventing fully quantitative measurements of the quantities of interest.

The environment as well as the food production provide a number of both natural and synthetic compounds whose effects on human being as an organism have not yet been determined nor investigated.

The present technology deals with jewels based on shape memory alloys and fabricated through additive manufacturing. In ICMATE-Lecco laboratories, several NiTi-based rings have been fabricated through a powder bed fusion technology (selective laser melting technique).

The proposing team that works at CNR ISTEC has recently patented a technology for the production of the Smart Polycrystals (SP), i.e. transparent YAG-based ceramic polycrystals (Y₃Al₅O₁₂) variably doped with rare earths ions and transition metals ions. The SPs solve the problem of the reduction of the efficiency in the solid state laser systems caused by the inhomogeneous heating of the single crystals during the emission process.

Polymer development is approaching to a new stage of advancement in which new functionalities especially in combination with conductive polymers and nanomaterials are more effective. In this context the study of new composites is the key to enable the development of disruptive technologies as additive manufacturing. Increasing electrical conductivity open the way to a new class of objects to be prototyped rapidly at low cost with a high level of customization.

X-ray imaging techniques can work in i) "full-field mode" in which the object to study (or part of it) is completely illuminated by the X-ray beam; ii) "scanning mode" in which an X-ray beam, focused through an opportune optics, illuminates in succession contiguous areas of the sample under examination, and the transmitted wave is measured by a detector placed at a proper distance from it. One of these X-ray scanning microscopes is available at the facility (X-ray MicroImaging, XMIL@b) of the Institute of Crystallography (CNR-Bari).