Technologies

Nowadays, to properly design and develop advanced materials capable to preserve for long times their performance under aggressive environments such as power generation plants, renewables, nuclear reactors and electronics of new generation, transport on ground and on space, aeronautics, catalysis, biomedical implants, the optimization of metallurgical processes involved is crucial.

The constant demand for more powerful and energy-efficient electronic devices than existing ones is challenging scientists and companies to develop innovative solutions that can address such primary technological needs. Based on a recent scientific discovery made by our team we have developed a technology for superfast and extremely scalable logic and computing circuits with minimal energy losses, which has the potential to become the leading technology in the future world of largescale computing and telecommunication infrastructures.

VisLab laboratory of IMM possesses a latest generation Raman micro-spectroscope equipped for vibrational measurements with high spatial and spectral resolution, at controlled temperature and in fast-imaging. The apparatus can be used to collect information and chemico-physical maps without the need for sample preparation and alteration, therefore for non-destructive studies and in operating conditions.

The proposed technology offers a novel and versatile method for detecting cracks in insulating materials of electrically polarized metal devices, i.e. dielectric coatings on metals, especially in low-pressure gas environments. It uses an ionized plasma that interacts uniformly with the insulating surface, allowing to detect defects invisible to the naked eye. The detection occurs in a single test without changing the environmental conditions and without risking harmful electrical discharges.

Optical backplane for interconnection between boards of a high-capacity ICT apparatus, data-center, server and the related automatic assembly method. The solution is based on optical connections between boards with an optimized layout on a support with mechanical constraints that involve controlled deformations of commercial optical fibers with standardized connectors. The entire interconnection circuit is divided into N independent circuits, each of which makes the connections between all the boards (Full-Mesh).

The metasurface optomechanical modulator is a device designed to modulate the amplitude, phase and polarization of a beam of electromagnetic radiation, independently, or simultaneously, according to prescribed paths in the parameter space (for example, as regards polarization, paths on the Poincaré sphere). The concept of our device can be applied to the entire spectrum of electromagnetic waves: from radio frequency, to microwaves (GHz), to millimeter waves (THz), to far and near infrared radiation, and to visible light.

The Q-PLL is an innovative nonlinear circuit which is able to synchronize to a signal comprising two or more incommensurate frequencies (forcing).

When the forcing contains two prevailing frequencies the locking response is a third frequency parametrically selected among those prescribed by the theory of three-frequency resonances in dynamical systems.

In particular, the locked frequency is closely related to the pitch perception of complex sound in humans.

The working principle of VTTJ is extremely simple. Two parts (at least one with tube shape) are screwed one into the other with a mechanical interference that creates a metallic seal. One part presents a cylindrical slot, the other presents a conical ring, whose diameter is slightly larger than the one of the cylindrical slot. When the two parts are screwed together, a plastic deformation occurs in the mechanical interference region.

X-ray imaging techniques can work in i) "full-field mode" in which the object to study (or part of it) is completely illuminated by the X-ray beam; ii) "scanning mode" in which an X-ray beam, focused through an opportune optics, illuminates in succession contiguous areas of the sample under examination, and the transmitted wave is measured by a detector placed at a proper distance from it. One of these X-ray scanning microscopes is available at the facility (X-ray MicroImaging, XMIL@b) of the Institute of Crystallography (CNR-Bari).