Current standard SPECTs, in order to achieve high resolutions, use a multi-pinholes technology that requires numerous data processing to limit the effects of image distortion. The proposed SSR-SPECT scanner, uses a parallel-hole collimator and therefore does not require numerical reprocessing of the data to obtain correct information on the images, while assuring spatial resolutions close to those of the pinholes through the acquisition of sequences of images shifted from one to another.
Technologies
In this section it is possible to view, also through targeted research, the technologies inserted in the PROMO-TT Database. For further information on the technologies and to contact the CNR Research Teams who developed them, it is necessary to contact the Project Manager (see the references at the bottom of each record card).
Displaying results 1 - 5 of 5
Time-correlated single photon counting (TCSPC) is regarded as the “gold-standard” method for fluorescence lifetime measurements. However, TCSPC requires using highly sensitive detectors, not suitable for measurements under bright light conditions, thereby making the use impractical in clinical settings. The invention described here solves this problem by synchronizing the fluorescence detection with an external light source.
The Nikon reference centre at IBPM ( www.imagingplatformibpmcnr.it ) is a microscopy platform for high resolution imaging of fixed samples and live cells (time-lapse video recording, both wide field and confocal spinning disk). Multimodal (fluorescence and transmitted light) and multidimensional (in x,y,z, 4 wavelengths, over time) acquisition modes are in place.
We present a technology for the multiscale isolation (analytical-laboratory-production) of Extracellular Vesicles (VE), which overcomes the limitations of the currently available methods. As opposed to traditional "affinity-based" systems that exploit antibodies, our technology represents a radical paradigm shift in the development of affinity probes for vesicles, i.e.
X-ray imaging techniques can work in i) "full-field mode" in which the object to study (or part of it) is completely illuminated by the X-ray beam; ii) "scanning mode" in which an X-ray beam, focused through an opportune optics, illuminates in succession contiguous areas of the sample under examination, and the transmitted wave is measured by a detector placed at a proper distance from it. One of these X-ray scanning microscopes is available at the facility (X-ray MicroImaging, XMIL@b) of the Institute of Crystallography (CNR-Bari).