Technologies

Nowadays, to properly design and develop advanced materials capable to preserve for long times their performance under aggressive environments such as power generation plants, renewables, nuclear reactors and electronics of new generation, transport on ground and on space, aeronautics, catalysis, biomedical implants, the optimization of metallurgical processes involved is crucial.

VisLab laboratory of IMM possesses a latest generation Raman micro-spectroscope equipped for vibrational measurements with high spatial and spectral resolution, at controlled temperature and in fast-imaging. The apparatus can be used to collect information and chemico-physical maps without the need for sample preparation and alteration, therefore for non-destructive studies and in operating conditions.

AIS aim is a robotized inclinometer measurement in standard inclinometer boreholes. The deep measurements have multiple applications, including: evaluating the rate of deep-seated ground deformation in landslide areas, evaluating the volume of deep-seated landslides and assessing landslide hazards. The AIS is composed by an electronic control manager, an inclinometer probe and an electric motor equipped with a high precision encoder for handling and continuous control of the probe in the borehole.

An interoperable and modular Digital Geospatial Ecosystem (DGE) is proposed, designed, implemented and tested in order to: collect in real time, manage and share geographic data; make usable tools and functionalities to support actions to prevent, monitor and mitigate impacts from extreme events as well as to prepare for and respond to emergency situations. The DGE is composed of the following modules:

The invention consists in a special regulation method of the horizontal axes of operating and rubbing wheels of a centerless grinding machine coupled with an opportune blade profile, allowing a continuous regulation of blade rest angle (angle between tangent to blade profile at the contact point with the work piece and the horizon, denoted by γ) and workpiece height (denoted by hw), without requiring blade substitution and/or manual regulations.

X-ray imaging techniques can work in i) "full-field mode" in which the object to study (or part of it) is completely illuminated by the X-ray beam; ii) "scanning mode" in which an X-ray beam, focused through an opportune optics, illuminates in succession contiguous areas of the sample under examination, and the transmitted wave is measured by a detector placed at a proper distance from it. One of these X-ray scanning microscopes is available at the facility (X-ray MicroImaging, XMIL@b) of the Institute of Crystallography (CNR-Bari).